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Time resolved X-ray Resonant Magnetic Scattering in reflection geometry

2010/09/17 by Stefan Buschhorn, Frank Brüssing, Buschhorn, Stefan +5
Physics and Astronomy · #FOS: Physical sciences #Mesoscale and Nanoscale Physics (cond-mat.mes-hall) #cond-mat.mes-hall

paper · pdf · doi:10.48550/arxiv.1009.3389

arxiv created 2010/09/17 · arxiv updated 2010/09/20

Abstract

We present a new setup to measure element-selective magnetization dynamics using the ALICE chamber (RSI 74, 4048 (2003)) at the BESSY II synchrotron at the Helmholtz-Zentrum Berlin. A magnetic field pulse serves as excitation, and the magnetization precession is probed by element selective X-ray Resonant Magnetic Scattering (XRMS). With the use of single bunch generated x-rays a temporal resolution well below 100 ps is reached. The setup is realized in reflection geometry and enables investigations of thin films described here, multilayers, and laterally structured samples. The combination of the time resolved setup with a cryostat in the ALICE chamber will allow to conduct temperature-dependent studies of precessional magnetization dynamics and of damping constants over a large temperature range and for a large variety of systems in reflection geometry.

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