2022/05/21 by Alankar Kotwal, Kotwal, Alankar, Anat Levin +3 · 1 citation
Computer Science · Engineering · Physics and Astronomy · #Advanced Optical Sensing Technologies #Computer Vision and Pattern Recognition (cs.CV) #FOS: Computer and information sciences #FOS: Physical sciences #Optical Coherence Tomography Applications #Optical measurement and interference techniques #Optics (physics.optics)
paper · pdf · doi:10.48550/arxiv.2205.10655
openalex publication_date 2022/05/21 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
We present a new imaging technique, swept-angle synthetic wavelength interferometry, for full-field micron-scale 3D sensing. As in conventional synthetic wavelength interferometry, our technique uses light consisting of two narrowly-separated optical wavelengths, resulting in per-pixel interferometric measurements whose phase encodes scene depth. Our technique additionally uses a new type of light source that, by emulating spatially-incoherent illumination, makes interferometric measurements insensitive to aberrations and (sub)surface scattering, effects that corrupt phase measurements. The resulting technique combines the robustness to such corruptions of scanning interferometric setups, with the speed of full-field interferometric setups. Overall, our technique can recover full-frame depth at a lateral and axial resolution of 5 microns, at frame rates of 5 Hz, even under strong ambient light. We build an experimental prototype, and use it to demonstrate these capabilities by scanning a variety of objects, including objects representative of applications in inspection and fabrication, and objects that contain challenging light scattering effects.