Calculation of the effect of slit size on emittance measurements made by a two-slit scanner

2015/03/20 by Richard D’Arcy, D'Arcy, Richard, A. Shemyakin +1
Engineering · #Accelerator Physics (physics.acc-ph) #Electromagnetic Compatibility and Measurements #FOS: Physical sciences #Particle Accelerators and Free-Electron Lasers #Particle accelerators and beam dynamics

paper · pdf · doi:10.48550/arxiv.1503.06055

openalex publication_date 2015/03/20 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28

Abstract

Parallel slit-slit devices are commonly used to measure the transverse emittance of a particle beam, selecting a portion of the beam with the front slit and measuring the angular distribution with the rear. This paper calculates the effect of finite slit sizes on measured emittance and Twiss functions in the case of Gaussian spatial and angular distributions of the oncoming beam. A formula for recovering the true emittance from the measured values is derived.

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