2015/05/04 by Vasko, A. C., G Warrell, E Parsai +5
Engineering · Physics and Astronomy · #Electronic Packaging and Soldering Technologies #FOS: Physical sciences #Materials Science (cond-mat.mtrl-sci) #Semiconductor materials and devices #Semiconductor materials and interfaces
paper · pdf · doi:10.48550/arxiv.1505.00822
openalex publication_date 2015/05/04 · openalex created_date 2016/06/24 · openalex updated_date 2026/07/28
We have investigated the influence of electric field on tin whisker growth. Sputtered tin samples were exposed to electron radiation, and were subsequently found to have grown whiskers, while sister control samples did not exhibit whisker growth. Statistics on the whisker properties are reported. The results are considered encouraging for substantiating an electrostatic theory of whisker growth, and the technique offers promise for investigating early stages of whisker growth in general and establishing whisker-related accelerated life testing protocols.