Characterization of the individual short-term frequency stability of Cryogenic Sapphire Oscillators at the 1e-16 level

2015/12/10 by Christophe Fluhr, Serge Grop, Fluhr, Christophe +9
Physics and Astronomy · #FOS: Physical sciences #Instrumentation and Detectors (physics.ins-det) #physics.ins-det

paper · pdf · doi:10.48550/arxiv.1512.03208

7 pages, 8 figures

arxiv created 2015/12/10 · arxiv updated 2015/12/11

Abstract

We present the characterisation of three Cryogenic Sapphire Oscillators using the three-corner-hat method. Easily implemented with commercial components and instruments, this method reveals itself very useful to analyse the frequency stability limitations of these state-of-the-art ultra-stable oscillators. The best unit presents a fractional frequency stability better than 5e-16 at 1 s and below 2e-16 for integration times less than 5,000s.

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