2001/06/13 by C. Cantoni, Cantoni, C., D. K. Christen +12
Materials Science · Physics and Astronomy · #Electronic and Structural Properties of Oxides #FOS: Physical sciences #Materials Science (cond-mat.mtrl-sci) #Physics of Superconductivity and Magnetism #Superconductivity (cond-mat.supr-con) #ZnO doping and properties #cond-mat.mtrl-sci #cond-mat.supr-con
paper · pdf · doi:10.48550/arxiv.cond-mat/0106254
14 pages, 4 figures
arxiv created 2001/06/13 · openalex publication_date 2001/06/13 · arxiv updated 2009/11/30 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
The epitaxial deposition of the first oxide buffer layer (seed layer) on biaxially textured Ni tape for coated conductors is a critical step that is dependent on the atomistic surface condition of the metal. We present a study of the 100<100> biaxially textured Ni (001) surface and seed-layer growth using in situ reflection high-energy electron diffraction (RHEED) and Auger electron spectroscopy (AES). Our observations are consistent with formation of a c(2 x 2) 2-D superstructure due to surface segregation of sulfur contained in the metal. We show that this superstructure can have a dramatic effect on the heteroepitaxial growth of oxide seed layers. In particular, the surface superstructure promotes the (200) epitaxial oxide growth of Y2O3-stabilized ZrO2 (YSZ), which is necessary for the development of high-Jc superconducting films for coated conductors.