2019/01/24 by Sala, Simone, Daurer, Benedikt J., Odstrcil, Michal +7
#FOS: Electrical engineering #FOS: Physical sciences #Image and Video Processing (eess.IV) #Optics (physics.optics) #electronic engineering #information engineering
paper · doi:10.48550/arxiv.1901.08970
The pressing need for the detailed wavefront properties of ultra-bright and ultra-short pulses produced by free-electron lasers (FELs) has spurred the development of several complementary characterization approaches. Here we present a method based on ptychography that can retrieve full high-resolution complex-valued wave functions of individual pulses. Our technique is demonstrated within experimental conditions suited for diffraction experiments in their native imaging state. This lensless technique, applicable to many other short-pulse instruments, can achieve diffraction-limited resolution.