2021/10/18 by Lukas Wagner, Wagner, Lukas, Patrick Schygulla +23 · 1 citation
Engineering · Materials Science · #Applied Physics (physics.app-ph) #Chalcogenide Semiconductor Thin Films #FOS: Physical sciences #Perovskite Materials and Applications #Quantum Dots Synthesis And Properties
paper · pdf · doi:10.48550/arxiv.2110.09353
openalex publication_date 2021/10/18 · openalex created_date 2022/07/25 · openalex updated_date 2026/07/28
The photocurrent density-voltage (J(V)) curve is the fundamental characteristic to assess opto-electronic devices, in particular solar cells. However, it only yields information on the performance integrated over the entire active device area. Here, a method to determine a spatially resolved photocurrent image by voltage-dependent photoluminescence microscopy is derived from basic principles. The opportunities and limitations of the approach are studied by the investigation of III-V and perovskite solar cells. This approach allows the real-time assessment of the microscopically resolved local J(V) curve, the steady-state Jsc, as well as transient effects. In addition, the measurement contains information on local charge extraction and interfacial recombination. This facilitates the identification of regions of non-ideal charge extraction in the solar cells and enables to link these to the processing conditions. The proposed technique highlights that, combined with potentiostatic measurements, luminescence microscopy turns out to be a powerful tool for the assessment of performance losses and the improvement of solar cells.