2009/09/26 by Vladimir N. Strocov, V. N. Strocov, Strocov, V. N.
Physics and Astronomy · #Accelerator Physics (physics.acc-ph) #Advanced X-ray Imaging Techniques #Crystallography and Radiation Phenomena #FOS: Physical sciences #Instrumentation and Detectors (physics.ins-det) #Optics (physics.optics) #X-ray Spectroscopy and Fluorescence Analysis #physics.acc-ph #physics.ins-det #physics.optics
paper · pdf · doi:10.48550/arxiv.0909.4874
Submitted to Journal of Synchrotron Radiation
arxiv created 2009/09/26 · openalex publication_date 2009/09/26 · arxiv updated 2009/12/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
A spectrometer for resonant inelastic X-ray scattering (RIXS) is proposed where imaging and dispersion actions in two orthogonal planes are combined to deliver full two-dimensional map of RIXS intensity in one shot with parallel detection in incoming hvin and outgoing hvout photon energies. Preliminary ray-tracing simulations with a typical undulator beamline demonstrate a resolving power well above 11000 in both hvin and hvout near a photon energy of 930 eV, with a vast potential for improvement. Combining such a spectrometer - nicknamed hv2 - with an XFEL source allows efficient time-resolved RIXS experiments.