2011/02/11 by Victor Giurgiutiu, Giola Santoni-Bottai, Giola Santoni · 4 citations
Engineering · #Acoustics #Composite material #Composite number #Electrical engineering #Electrical impedance #Electronic engineering #Engineering #Materials science #Modal #Modal analysis #Non-Destructive Testing Techniques #Optoelectronics #Physics #Piezoelectric sensor #Piezoelectricity #Structural Health Monitoring Techniques #Structural engineering #Structural health monitoring #Ultrasonics and Acoustic Wave Propagation #Vibration #Wafer
paper · doi:10.2514/1.j050641
openalex publication_date 2011/02/11 · openalex created_date 2025/10/10 · openalex updated_date 2026/08/01
PiezoelectricQ2 wafer active sensors are lightweight and inexpensive enablers for a large class of structural health monitoring applications such as 1) embedded guided-wave ultrasonics, i.e., pitch–catch, pulse–echo, and phased arrays; 2) high-frequency modal sensing, i.e., the electromechanical impedance method; and 3) passive detection (acoustic emission and impact detection). The focus of this paperwill be on the challenges and opportunities posed by use of piezoelectric-wafer active sensors for structural health monitoring of composite structures as different from that of themetallic structures onwhich thismethodologywas initially developed.After a brief introduction, thepaper discusses damage modes in composites. Then it reviews the structural health monitoring principles based on piezoelectric-wafer active sensors. This is followed by a discussion of guided-wave propagation in composites and how piezoelectric-wafer active sensor tuning can be achieved. Finally, the paper presents some damage detection results in composites: 1) hole damage in unidirectional and quasi-isotropic plates and 2) impact damage in quasi-isotropic plates. The paper ends with conclusions and suggestions for further work. Nomenclature A = overall transfer matrix for the composite laminate Ak =Q3 transfer matrix for the kth layer in the TM method Ak = amplitude of the partial waves in the kth layer in the global matrix method A0, A1, A2 =Q4 antisymmetric Lamb-wave modes a = half-length of the piezoelectric-wafer active sensors, m C = electrical capacitance, F C = stiffness matrix of the composite layer in global coordinates, Pa C0 = stiffness matrix of the composite layer in local coordinates, Pa c = phase velocity of the wave, m=s cE = energy velocity of the wave, m=s cg = group velocity of the wave, m=s cs = phase velocity of the shear wave, m=s D = 4 4 field matrix that relates the amplitudes of partial waves to the displacement and stress fields Dj = electrical displacement tensor, C=m 2 d = half-thickness, m dkij = piezoelectric constant, m=V Ek = electrical field tensor, V=m E1 = axial modulus, Pa E2 = transverse modulus, Pa