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Confocal structured illumination microscopy

2024/05/24 by Weishuai Zhou, Manhong Yao, Zhou, Weishuai +9
Biochemistry, Genetics and Molecular Biology · #Advanced Fluorescence Microscopy Techniques #FOS: Electrical engineering #FOS: Physical sciences #Image and Video Processing (eess.IV) #Optics (physics.optics) #electronic engineering #information engineering

paper · pdf · doi:10.48550/arxiv.2405.15519

openalex publication_date 2024/05/24 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28

Abstract

Confocal microscopy, a critical advancement in optical imaging, is widely applied because of its excellent anti-noise ability. However, it has low imaging efficiency and can cause phototoxicity. Optical-sectioning structured illumination microscopy (OS-SIM) can overcome the limitations of confocal microscopy but still face challenges in imaging depth and signal-to-noise ratio (SNR). We introduce the concept of confocal imaging into OS-SIM and propose confocal structured illumination microscopy (CSIM) to enhance the imaging performance of OS-SIM. CSIM exploits the principle of dual photography to reconstruct a dual image from each pixel of the camera. The reconstructed dual image is equivalent to the image obtained by using the spatial light modulator (SLM) as a virtual camera, enabling the separation of the conjugate and non-conjugate signals recorded by the camera pixel. We can reject the non-conjugate signals by extracting the conjugate signal from each dual image to reconstruct a confocal image when establishing the conjugate relationship between the camera and the SLM. We have constructed the theoretical framework of CSIM. Optical-sectioning experimental results demonstrate that CSIM can reconstruct images with superior SNR and greater imaging depth compared with existing OS-SIM. CSIM is expected to expand the application scope of OS-SIM.

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