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Diagnostic and Detectors for Charging and Damage of Dielectrics in High-gradient Accelerators

2015/10/19 by S. V. Shchelkunov, Sergey V. Shchelkunov, T. C. Marshall +5
Engineering · Physics and Astronomy · #Accelerator Physics (physics.acc-ph) #Electromagnetic Launch and Propulsion Technology #FOS: Physical sciences #Nuclear Physics and Applications #Pulsed Power Technology Applications #physics.acc-ph

paper · pdf · doi:10.48550/arxiv.1510.05507

Presentation at the DPF 2015 Meeting of the American Physical Society Division of Particles and Fields,Ann Arbor, Michigan, August 4-8, 2015

arxiv created 2015/10/19 · openalex publication_date 2015/10/19 · arxiv updated 2015/10/20 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28

Abstract

The research is aimed to address issues of analysis and mitigation of high repetition rate effects in Dielectric Wakefield Accelerators, and more specifically, to study charging rate and charge distribution in a thin walled dielectric wakefield accelerator from a passing charge bunch and the physics of conductivity and discharge phenomena in dielectric materials useful for such accelerator applications. The issue is the role played by the beam halo and intense wakefields in charging of the dielectric, possibly leading to undesired deflection of charge bunches and degradation of the dielectric material. The detector that was developed is based on measurement of the complex electrical conductivity, which would appear as a transient phenomenon accompanying the passage of one or more charge bunches, by observing the change of complex admittance of a resonant microwave cavity that is fitted around the dielectric tubing. The detector also can detect permanent damage to the material. During initial stage of development, microwave apparatus was built and signal processing was developed for observing time-dependent electronic charging of dielectric surfaces and/or plasmas located on or near the inner surface of a thin-wall hollow dielectric tube. Three frequencies were employed to improve the data handling rate and the signal-to-noise. The test and performance results for a plasma test case will be presented; in particular, the performance of the test unit showed capability to detect small changes ~ 0.1% of a dielectric constant, which would correspond to the scraping-off of only 0.3nC to the walls of the dielectric liner inside the cavity from the passing charge bunch.

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