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Maximizing the electric field strength in the foci of high numerical aperture optics

2008/11/13 by Markus Sondermann, Sondermann, Markus, Norbert Lindlein +3
Computer Science · Engineering · Physics and Astronomy · #FOS: Physical sciences #Near-Field Optical Microscopy #Optics (physics.optics) #Orbital Angular Momentum in Optics #Quantum Information and Cryptography #Quantum Physics (quant-ph) #Quantum and Classical Electrodynamics #physics.optics #quant-ph

paper · pdf · doi:10.48550/arxiv.0811.2098

9 pages, 8 figures, rewritten Sec. II (contains now a revised derivation of the central formula which was in Sec. V in former versions), rewritten Sec. V (some additional examples added -> new Fig. 8), inclusion of some references to publications that appeared since the last version

openalex publication_date 2008/11/13 · arxiv created 2011/10/13 · arxiv updated 2011/10/18 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28

Abstract

Several applications require spatial distributions of the incident electric field that maximize the electric field at a focal point for a given input power. The field distributions are derived for various optical systems in a direct way based on fundamental physical properties. The results may prove useful for a wide range of applications, e.g., microscopy, scattering experiments or excitation of single atoms. For commonly used distributions - fundamental Gaussian modes and doughnut modes - we give the upper bounds of the achievable field amplitudes.

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