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Fourfold Symmetry of Anisotropic Magnetoresistance in Epitaxial Fe3O4 Thin Films

2011/05/29 by C. R. Hu, Chaowei Hu, Hu, C. R. +10
Engineering · Materials Science · Physics and Astronomy · #FOS: Physical sciences #Magnetic Properties and Synthesis of Ferrites #Magnetic properties of thin films #Magneto-Optical Properties and Applications #Materials Science (cond-mat.mtrl-sci) #cond-mat.mtrl-sci

paper · pdf · doi:10.48550/arxiv.1105.5781

18 pages, 6 figure

arxiv created 2011/05/29 · openalex publication_date 2011/05/29 · arxiv updated 2011/05/31 · openalex created_date 2016/06/24 · openalex updated_date 2026/07/28

Abstract

We studied the angular dependence of anisotropic magnetoresistance (AMR) and Planar Hall effect (PHE) at various temperatures in high quality epitaxial Fe3O4 films grown on MgO(001) substrates. The PHE contains only a twofold angular dependence, but the AMR below 200K is constituted with both twofold and fourfold symmetric terms. A quantitative fitting based on a phenomenological model indicates the nonmonotonics temperature dependence of the twofold component of AMR can be ascribed to the competition between the term and the term. A unidirectional component was observed in the angular dependent AMR. The fourfold symmetric AMR also existed for the magnetic field rotating in the plane perpendicular to the current. Our results indicate the AMR and PHE in single crystalline films have different origins, and also prove that the origin of the four-fold symmetry of AMR is related to the lattice symmetry rather than the spin scattering near the antiphase boundaries.

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