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Measurement circuit effects in three-terminal electrical transport measurements

2021/04/06 by Esteban A. Martinez, Andreas Pöschl, Martinez, Esteban A. +13 · 1 citation
Computer Science · Engineering · Physics and Astronomy · #Advanced Electrical Measurement Techniques #Microwave and Dielectric Measurement Techniques #Sensor Technology and Measurement Systems #cond-mat.mes-hall

paper · pdf · doi:10.48550/arxiv.2104.02671

5 pages, 4 figures

arxiv created 2021/04/06 · arxiv updated 2021/04/07

Abstract

In this article we study measurement circuit effects in three-terminal electrical transport measurements arising from finite line impedances. We provide exact expressions relating the measured voltages and differential conductances to their values at the device under test, which allow for spurious voltage divider effects to be corrected. Finally, we test the implementation of these corrections with experimental measurements.

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