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Origin of resistivity minima at low temperature in ferromagnetic metallic manganites

2008/04/26 by Pankaj R. Sagdeo, P. R. Sagdeo, R. J. Choudhary +4
Engineering · Materials Science · Physics and Astronomy · #Electrical and Thermal Properties of Materials #Electronic and Structural Properties of Oxides #FOS: Physical sciences #Magnetic and transport properties of perovskites and related materials #Materials Science (cond-mat.mtrl-sci) #Strongly Correlated Electrons (cond-mat.str-el) #cond-mat.mtrl-sci #cond-mat.str-el

paper · pdf · doi:10.48550/arxiv.0804.4247

Figure-3 and figure-4 are important new results

arxiv created 2008/04/26 · openalex publication_date 2008/04/26 · arxiv updated 2009/12/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28

Abstract

The resistivity and magnetoresistance measurements were carried out on thin film of La0.7Ca0.3MnO3 to investigate the possible origin of low temperature resistivity minimum observed in these samples. We observed large hysteresis in the magnetoresistance at low temperature; 5K and the sample current I has large effect on resistivity minima temperature. The observation of hysteresis at low temperatures suggests the presence of inhomogeneity at low temperatures. These in-homogeneities consist of regions of different resistive phases. It appears that the high resistive phase prevents the tunneling of charge carriers between two low resistive regions and thus giving rise to the resistivity minimum in these samples.

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