2020/06/17 by Rakesh Prasad, Rakesh K. Prasad, Prasad, Rakesh K. +2
Engineering · Physics and Astronomy · #FOS: Physical sciences #Force Microscopy Techniques and Applications #Instrumentation and Detectors (physics.ins-det) #Near-Field Optical Microscopy #Surface and Thin Film Phenomena #physics.ins-det
paper · pdf · doi:10.48550/arxiv.2006.09971
21 pages, 4 figures
arxiv created 2020/06/17 · openalex publication_date 2020/06/17 · arxiv updated 2020/06/18 · openalex created_date 2020/06/25 · openalex updated_date 2026/07/28
Electrical measurement of nano-scale devices and structures requires skills and hardware to make nano-contacts. Such measurements have been difficult for number of laboratories due to cost of probe station and nano-probes. In the present work, we have demonstrated possibility of assembling low cost probe station using USB microscope (US 30) coupled with in-house developed probe station. We have explored the effect of shape of etching electrodes on the geometry of the microprobes developed. The variation in the geometry of copper wire electrode is observed to affect the probe length (0.58 mm to 2.15 mm) and its half cone angle (1.4 to 8.8 degree). These developed probes were used to make contact on micro patterned metal films and was used for electrical measurement along with semiconductor parameter analyzer. These probes show low contact resistance ( 4 ohm) and follows ohmic behavior. Such probes can be used for laboratories involved in teaching and multidisciplinary research activities and Atomic Force Microscopy.