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Scanning Raman spectroscopy for characterizing compositionally spread films

2004/07/08 by A. Venimadhav, Venimadhav, A., K. A. Yates +3
Earth and Planetary Sciences · Materials Science · Physics and Astronomy · #Electronic and Structural Properties of Oxides #FOS: Physical sciences #High-pressure geophysics and materials #Magnetic and transport properties of perovskites and related materials #Materials Science (cond-mat.mtrl-sci) #cond-mat.mtrl-sci

paper · pdf · doi:10.48550/arxiv.cond-mat/0407209

14 pages, 4 figures

arxiv created 2004/07/08 · openalex publication_date 2004/07/08 · arxiv updated 2009/12/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28

Abstract

Composition-spread La1-xSrxMnO3 thin films were prepared by pulsed laser deposition technique from LaMnO3 and SrMnO3 targets. The films were epitaxial with a continuous variation of the out of plane lattice parameter along the direction of composition gradient. Scanning Raman spectroscopy has been employed as a non-destructive tool to characterize the composition-spread films. Raman spectra showed the variation of the structural, Jahn Teller distortions and the presence of coexisting phases at particular compositions that are in agreement with the previous observation on the single crystal samples. Raman spectra on the continuous composition-spread film also reveal the effect of disorder and strain on the compositions.

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