2023/05/13 by Rakesh R. Kamath, Hahn Choo, Kamath, Rakesh R. +5 · 1 citation
Engineering · #Additive Manufacturing Materials and Processes #Advanced Semiconductor Detectors and Materials #FOS: Physical sciences #Materials Science (cond-mat.mtrl-sci) #Thermography and Photoacoustic Techniques
paper · pdf · doi:10.48550/arxiv.2305.08020
openalex publication_date 2023/05/13 · openalex created_date 2023/05/17 · openalex updated_date 2026/07/31
Understanding the spatio-temporal evolution of thermal gradient (G) at and velocity (R) of the solid-liquid and liquid-vapor interfaces is critical for the control of site-specific microstructures in additive manufacturing. In-situ dynamic x-ray radiography (DXR) has been used in recent years to probe the evolution of R with high spatial and temporal resolutions. However, the current methods used to measure the temperature (and therefore, G) are inadequate for sub-melt-pool surface measurement (e.g. thermography) or have lower resolution or limited field-of-view (e.g. x-ray diffraction). In this study, we demonstrate a novel approach to estimate the sub-surface temperature distribution and its time evolution with significantly higher resolutions using DXR data. This methodology uses the Beer-Lambert's law as a physical basis and is demonstrated using an in-situ laser spot-melting experiment on Ti-6Al-4V alloy.