Thickness dependence of critical currents in thin superconductors

2002/07/22 by A. Gurevich, Gurevich, A.
Physics and Astronomy · #FOS: Physical sciences #Superconductivity (cond-mat.supr-con) #cond-mat.supr-con

paper · pdf · doi:10.48550/arxiv.cond-mat/0207526

3 pages, 2 figures

arxiv created 2002/07/22 · arxiv updated 2009/11/30

Abstract

Mechanisms of vortex dynamics and pinning and self-field effects which could account for the thickness dependence of the critical current density J_c of superconducting films are addressed. It is shown that at low magnetic fields B, the 2D single-vortex pinning and thermal fluctuations yield J_c proportional to (1/sqrtd)exp[-(d_m/d)^1/2], if the film thickness d is smaller than the pinning correlation length along B. The model describes the dependence of J_c on d observed on YBa₂Cu₃O₇ coated conductors for d < 2(mu)m. Measurements of J_c(d) in strong magnetic fields are proposed to probe whether the dependence of J_c on d is mostly determined by the 2D pinning or changes in the material microstructure as the film gets thicker.

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