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Improving axial resolution in SIM using deep learning

2020/09/04 by Miguel Boland, Edward A. K. Cohen, Boland, Miguel +5
Biochemistry, Genetics and Molecular Biology · Engineering · #Advanced Fluorescence Microscopy Techniques #Biological Physics (physics.bio-ph) #Computer Vision and Pattern Recognition (cs.CV) #FOS: Computer and information sciences #FOS: Electrical engineering #FOS: Physical sciences #I.2.10 #I.4.5 #Image Processing Techniques and Applications #Image and Video Processing (eess.IV) #Integrated Circuits and Semiconductor Failure Analysis #electronic engineering #information engineering

paper · pdf · doi:10.48550/arxiv.2009.02264

openalex publication_date 2020/09/04 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28

Abstract

Structured Illumination Microscopy is a widespread methodology to image live and fixed biological structures smaller than the diffraction limits of conventional optical microscopy. Using recent advances in image up-scaling through deep learning models, we demonstrate a method to reconstruct 3D SIM image stacks with twice the axial resolution attainable through conventional SIM reconstructions. We further evaluate our method for robustness to noise & generalisability to varying observed specimens, and discuss potential adaptions of the method to further improvements in resolution.

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