2025/01/15 by Anna Charvátová Campbell, Campbell, Anna Charvátová, Petr Klapetek +11
Engineering · #Advanced Measurement and Metrology Techniques #Calibration and Measurement Techniques #Data Analysis #FOS: Physical sciences #Materials Science (cond-mat.mtrl-sci) #Statistics and Probability (physics.data-an) #Thermography and Photoacoustic Techniques
paper · pdf · doi:10.48550/arxiv.2501.08961
openalex publication_date 2025/01/15 · openalex created_date 2025/10/10 · openalex updated_date 2026/08/01
Scanning thermal microscopy is a unique tool for the study of thermal properties at the nanoscale. However, calibration of the method is a crucial problem. When analyzing local thermal conductivity, direct calibration is not possible and reference samples are used instead. As the calibration dependence is non-linear and there are only a few calibration points, this represents a metrological challenge that needs complex data processing. In this contribution we present use of the OEFPIL algorithm for robust and single-step evaluation of local thermal conductivities and their uncertainties, simplifying this procedure. Furthermore, we test the suitability of SThM calibration for automated measurement.