MCX: a Synchrotron Radiation Beamline for X‐ray Diffraction Line Profile Analysis

2014/06/12 by Luca Rebuffi, Jasper R. Plaisier, Mahmoud Abdellatief +2 · 1 citation
Engineering · Materials Science · #Advanced ceramic materials synthesis #Metal and Thin Film Mechanics #X-ray Diffraction in Crystallography

paper · doi:10.1002/zaac.201400163

openalex publication_date 2014/06/12 · openalex created_date 2016/06/24 · openalex updated_date 2026/07/26

Abstract

Abstract The potential of modern methods for X‐ray diffraction Line Profile Analysis can be fully exploited with data collected at synchrotron radiation beamlines, provided that optics and experimental set‐up are suitably designed and characterized. The Material Characterization by X‐ray Diffraction beamline, MCX, at Elettra‐Sincrotrone Trieste, may operate with a set‐up optimally arranged to study nanostructured materials, investigating details of crystalline domain size and shape, lattice defects, and local atomic displacement of static and dynamic nature. Main features of MCX are briefly discussed and best operating conditions illustrated by representative case studies.

Citations

• Axial Divergence in a Conventional X-ray Powder Diffractometer. I. Theoretical Foundations

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• Liquid‐Processed 2D Aromatic Amorphous Carbon: Defect Engineering and Universal Transport Scaling

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