Yingchun Cheng
- A unified model for the flicker noise in metal-oxide-semiconductor field-effect transistors
1990/03/01 by K.K. Hung, Kuo-Hsiang Hung, P.K. Ko +4 · 882 citations
Engineering · #Advancements in Semiconductor Devices and Circuit Design #Artificial intelligence #Burst noise #CMOS #Computational physics #Computer science #Electrical engineering #Electronic engineering #Engineering #Field-effect transistor #Flicker #Flicker noise #Low-power high-performance VLSI design #Materials science #Noise (video) #Noise figure #Optoelectronics #Physics #Quantum mechanics #Semiconductor materials and devices #Statistical physics #Transistor #Voltage