Tengteng Lu
- Hot Carrier Degradation in MOSFETs at Cryogenic Temperatures Down to 4.2 K
2021/04/25 by Yuanke Zhang, Zhang, Yuanke, Chao Luo +9 · 1 citation
Engineering · #Advancements in Semiconductor Devices and Circuit Design #Applied Physics (physics.app-ph) #FOS: Physical sciences #Semiconductor materials and devices #Silicon Carbide Semiconductor Technologies