Fuchs, Udi

1. Robust multi-scale multi-feature deep learning for atomic and defect identification in Scanning Tunneling Microscopy on H-Si(100) 2x1 surface
   2020/02/11 by Maxim Ziatdinov, Ziatdinov, Maxim, Udi Fuchs +7 · 1 citation
   Biochemistry, Genetics and Molecular Biology · Materials Science · #Advanced Electron Microscopy Techniques and Applications #Applied Physics (physics.app-ph) #Electron and X-Ray Spectroscopy Techniques #FOS: Physical sciences #Machine Learning in Materials Science #Materials Science (cond-mat.mtrl-sci)