Bang, Seongdeok
- Background-Aware Defect Generation for Robust Industrial Anomaly Detection
2024/11/25 by Gwangyeol Kim, Cho, Youngjae, Sirojbek Safarov +6 · 1 citation
Engineering · #Advanced Surface Polishing Techniques #Artificial Intelligence (cs.AI) #Computer Vision and Pattern Recognition (cs.CV) #FOS: Computer and information sciences #Geophysical Methods and Applications #Non-Destructive Testing Techniques