Halder, Sandip

1. A Deep Learning Framework for Verilog Autocompletion Towards Design and Verification Automation
   2023/04/26 by Enrique Dehaerne, Bappaditya Dey, Dehaerne, Enrique +5 · 2 citations
   Computer Science · Engineering · #FOS: Computer and information sciences #Ferroelectric and Negative Capacitance Devices #I.2.2 #Machine Learning (cs.LG) #Semiconductor materials and devices #Software Engineering (cs.SE) #VLSI and Analog Circuit Testing
2. Addressing Class Imbalance and Data Limitations in Advanced Node Semiconductor Defect Inspection: A Generative Approach for SEM Images
   2024/07/14 by Bappaditya Dey, Vic De Ridder, Dey, Bappaditya +7 · 2 citations
   Engineering · #Industrial Vision Systems and Defect Detection #Integrated Circuits and Semiconductor Failure Analysis #Advancements in Photolithography Techniques
3. Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy
   2023/11/19 by Vic De Ridder, De Ridder, Vic, Bappaditya Dey +7 · 1 citation
   Engineering · #Advancements in Photolithography Techniques #Integrated Circuits and Semiconductor Failure Analysis #Industrial Vision Systems and Defect Detection
4. SEMI-CenterNet: A Machine Learning Facilitated Approach for Semiconductor Defect Inspection
   2023/08/14 by Vic De Ridder, Bappaditya Dey, De Ridder, Vic +9 · 1 citation
   Engineering · Materials Science · #Computer Vision and Pattern Recognition (cs.CV) #Electron and X-Ray Spectroscopy Techniques #FOS: Computer and information sciences #Industrial Vision Systems and Defect Detection #Integrated Circuits and Semiconductor Failure Analysis