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De Doncker, Philippe

  1. Joint data rate and EMF exposure analysis in Manhattan environments: stochastic geometry and ray tracing approaches
    2023/01/26 by Charles Wiame, Wiame, Charles, Simon Demey +7 · 1 citation
    Engineering · #FOS: Electrical engineering #Millimeter-Wave Propagation and Modeling #Power Line Communications and Noise #Signal Processing (eess.SP) #electronic engineering #information engineering