Tom, Joe

1. Dual Attention U-Net with Feature Infusion: Pushing the Boundaries of Multiclass Defect Segmentation
   2023/12/21 by Alshawi, Rasha, Hoque, Md Tamjidul, Ferdaus, Md Meftahul +7 · 3 citations
   #Computer Vision and Pattern Recognition (cs.CV) #FOS: Computer and information sciences