Si, Guangyuan

1. Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection
   2025/02/13 by Qingdong Ou, Ou, Qingdong, Shuwen Xue +29 · 1 citation
   Engineering · Materials Science · #Electron and X-Ray Spectroscopy Techniques #FOS: Physical sciences #Integrated Circuits and Semiconductor Failure Analysis #Near-Field Optical Microscopy #Optics (physics.optics)